EPSRC National Crystallography Service
Data Collection Summary kccd1 (dellboy)


Summary report for Directory: diska/04src0562

Report generated Jul 20, 2004; 09:01:23

Unit cell

3410 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p2
a (Angstrom)8.3045 +/- 0.0007
b (Angstrom)7.9058 +/- 0.0004
c (Angstrom)24.205 +/- 0.002
alpha (°) 90.000
beta (°)92.368 +/- 0.003
gamma (°) 90.000
Volume (A**3)1587.8 +/- 0.2
Mosaicity (°)0.398 +/- 0.003

Data collection

Summary

Total number of images collected170
Total exposure time14.6 hours
Data collection exposure time14.4 hours
Data collection wall-clock time14.7 hours

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f93186.0° phi2.000°320 secondsYes
data collections02f19 38.0° omega2.000°320 secondsYes
data collections03f50100.0° omega2.000°320 secondsYes
Phi/Chii01f - i08f8100 seconds

Scalepack Scaling

Deleted observations

Rejected 118
Zero sigma or profile test 120
Overload or incomplete profile 546
Sigma cutoff  28
High resolution limit  32

Final Data Set

Scale factor range9.07-10.04
Number of 'full' reflections 13870
Number of 'partial' reflections  5709
Total number of integrated reflections 18884
Total number of unique reflections  3694
Data completeness  95.0%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity    6.0
Average Sigma(I)    1.0
Overall R-merge (linear)  0.200

Sadabs Results

Parameter refinement on 5401 reflections reduced R(int) from 0.0839 to 0.0615

Before rejection, 18385 reflections total and 3701 unique

After rejection, 17886 reflections total and 3695 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    2.4  0.2164   0.977 - 1.086   0.941 - 1.100   1.212   10365    4005
    2   -1.8  0.2126   0.441 - 0.478   0.933 - 1.100   1.259    1970     723
    3   -1.8  0.2096   0.946 - 1.073   0.948 - 1.048   1.183    5551    2110
Ratio of minimum to maximum apparent transmission: 0.847886

Metadata

  Group    Service  
  Operator   Simon Coles  
  Sample Owner   Pelter  
  Local Code   AP / RTP 26  
  Formula   C38 H48 B2 Sn  
  Crystal Colour    Colourless  
  Crystal Habit    Plate  
  Crystal Size   0.08 x 0.06 x 0.01 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    'graphite'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. SADABS - Bruker Nonius area detector scaling and absorption correction - V2.10

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/