EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: diska/2009src0345r

Report generated Apr 07, 2009; 12:55:25

Unit cell

55702 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p2
a (Angstrom)23.3867 +/- 0.0014
b (Angstrom)6.8700 +/- 0.0003
c (Angstrom)24.3510 +/- 0.0015
alpha (°) 90.000
beta (°)89.943 +/- 0.003
gamma (°) 90.000
Volume (A**3)3912.4 +/- 0.4
Mosaicity (°)1.288 +/- 0.002

Data collection

Summary

Total number of images collected361
Total exposure time95.0 minutes
Data collection exposure time93.7 minutes
Data collection wall-clock time110.7 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance40.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f196254.8° phi1.300°15 secondsYes
data collections02f65 84.5° omega1.300°15 secondsYes
data collections03f92119.6° omega1.300°15 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected   4
Zero sigma or profile test  57
Overload or incomplete profile1664
Sigma cutoff 858
High resolution limit 229

Final Data Set

Scale factor10.00
Number of 'full' reflections    27
Number of 'partial' reflections 30478
Total number of integrated reflections 17423
Total number of unique reflections  7199
Data completeness  74.6%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   37.7
Average Sigma(I)    2.5
Overall R-merge (linear)  0.101

Sadabs Results

Parameter refinement on 19912 reflections reduced R(int) from 0.3194 to 0.0744

Before rejection, 30995 reflections total and 9330 unique

After rejection, 25679 reflections total and 9169 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1   18.8  0.0747   0.670 - 1.037   0.922 - 1.298   2.056   14254    9306
    2   18.3  0.0751   0.638 - 0.780   0.916 - 1.185   2.065    5271    3176
    3   18.3  0.0691   0.660 - 0.817   0.965 - 1.365   2.039    6154    4212
Ratio of minimum to maximum apparent transmission: 0.671606

Metadata

  Group    Service  
  Operator   Sam Callear  
  Sample Owner   Prof P.Taylor  
  Local Code   SM 114bis  
  Formula   C15H17ClN4O6Si  
  Crystal Colour    Colourless  
  Crystal Habit    Block  
  Crystal Size   0.17 x 0.12 x 0.05 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS 2007/2 (Sheldrick, G.M., 2007)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type   'Bruker-Nonius APEX II CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   '4096x4096pixels / 62x62mm'

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2007). SADABS. Version 2007/2. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/