EPSRC
National Crystallography Service |
Data Collection Summary kccd2
(damien) |
Summary report for Directory: diska/2008lsh024
Report generated Jul 05, 2008; 19:54:44
Unit cell
3824 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement
Symmetry used in scalepack | p222 |
a (Angstrom) | 7.2391 +/- 0.0002 |
b (Angstrom) | 8.5936 +/- 0.0002 |
c (Angstrom) | 9.1897 +/- 0.0003 |
alpha (°) | 90.000 |
beta (°) | 90.000 |
gamma (°) | 90.000 |
Volume (A**3) | 571.69 +/- 0.03 |
---|
Mosaicity (°) | 0.423 +/- 0.002 |
Data collection
Summary
Total number of images collected | 177 |
Total exposure time | 30.0 minutes |
Data collection exposure time | 29.1 minutes |
Data collection wall-clock time | 36.5 minutes |
Experimental Conditions
Wavelength | 0.71073 A |
Crystal to detector distance | 30.00 mm |
Scans
Type | Name | # images | Total Rotation | Per frame Rotation | Exposure per frame | Used in scaling |
data collection | s01f | 49 | 98.0° omega | 2.000° | 10 seconds | Yes |
data collection | s02f | 49 | 98.0° omega | 2.000° | 10 seconds | Yes |
data collection | s03f | 47 | 94.0° omega | 2.000° | 10 seconds | Yes |
data collection | s04f | 24 | 48.0° omega | 2.000° | 10 seconds | Yes |
Phi/Chi | i01f - i08f | 8 | | | 7 seconds |
Scalepack Scaling
Deleted observations
Overload or incomplete profile | 330 |
Sigma cutoff | 57 |
High resolution limit | 5 |
Final Data Set
Scale factor | 10.00 |
Number of 'full' reflections | 4522 |
Number of 'partial' reflections | 2114 |
Total number of integrated reflections | 6288 |
Total number of unique reflections | 794 |
Data completeness | 99.7% |
Resolution range | 7.00-0.77 A |
Theta range | 2.91°-27.48° |
Average Intensity | 563.6 |
Average Sigma(I) | 8.6 |
Overall R-merge (linear) | 0.269 |
Sadabs Results
Parameter refinement on 5390 reflections reduced R(int) from 0.1358 to 0.0251
Before rejection, 6083 reflections total and 795 unique
After rejection, 5685 reflections total and 795 unique
Runs
Run 2-theta R(int) Incid. factors Diffr. factors K Total I>2sig(I)
1 7.2 0.0221 0.682 - 1.424 0.966 - 1.022 1.963 1670 1518
2 7.4 0.0267 0.675 - 0.982 0.985 - 1.062 2.126 1699 1496
3 10.2 0.0220 0.720 - 1.127 0.932 - 1.057 1.973 1554 1414
4 10.2 0.0308 1.097 - 1.267 0.996 - 1.068 2.280 762 635
Ratio of minimum to maximum apparent transmission: 0.872544
Metadata
  Group   | Mike Hursthouse   |
  Operator   | Susanne Huth   |
  Sample Owner   |   |
  Local Code   | PPU/Cl   |
  Formula   | C7 H7 Cl1 N2 O1   |
  Crystal Colour   | Colourless   |
  Crystal Habit   | Cut Block   |
  Crystal Size   | 0.16 x 0.16 x 0.12 (mm3)  |
  Temperature   | 120(K)  |
  Generator   | 50 (kV)   85 (mA)  |
  Primary Solvent   |   |
  Other Solvents   |   |
File Explanations
SampleCode.zip
SampleCode.hkl
- data corrected using SADABS
SampleCode_merge_none.hkl
- equivalents and friedels kept separate (See "Final Data
Set" table in this report)
SampleCode.p4p
- skeleton p4p file for use with XPREP
SampleCode.htm
- this summary file
Southampton CIF entry fields
_exptl_absorpt_process_details 'SADABS 2007/2
(Sheldrick, G.M.,
2007)'
_diffrn_ambient_temperature
120(2)
_diffrn_radiation_wavelength
0.71073
_diffrn_radiation_type
MoK\a
_diffrn_radiation_source
'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator '10cm confocal mirrors'
_diffrn_measurement_device_type 'Bruker-Nonius APEX II CCD camera on \k-goniostat'
_diffrn_measurement_method
'\f & \w scans'
_diffrn_detector_area_resol_mean '4096x4096pixels / 62x62mm'
_computing_data_collection
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W.,
1998)'
Software References
Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an
Obstinate List of Reflections. Journal
of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from
area-detector images. Journal of
Applied Crystallography 2000; 33:
893-898.
Diffractometer control and strategy
calculation using COLLECT:
Hooft RWW.
COLLECT data collection software, Nonius B.V., 1998.
Standard
Data Reduction using HKL(Denzo
& Scalepack):
Otwinowski Z, Minor W.
Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt
A. 1997; 276: 307-326.
Absorption Correction
Sheldrick, G. M. (2007). SADABS. Version 2007/2. Bruker AXS Inc., Madison,
Wisconsin, USA.
Non-Standard Data Reduction using
EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity
evaluation method: EVAL-14. Journal
of Applied Crystallography 2003; 36: 220-229.
For more information visit the service web site at: http://www.soton.ac.uk/~xservice/