EPSRC National Crystallography Service
Data Collection Summary kccd1 (dellboy)


Summary report for Directory: diska/04mbh0606

Report generated Jun 19, 2004; 18:21:02

Unit cell

3502 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p1
a (Angstrom)4.8817 +/- 0.0004
b (Angstrom)9.4444 +/- 0.0010
c (Angstrom)19.187 +/- 0.002
alpha (°)98.105 +/- 0.004
beta (°)95.209 +/- 0.006
gamma (°)97.941 +/- 0.006
Volume (A**3)861.87 +/- 0.15
Mosaicity (°)1.115 +/- 0.004

Data collection

Summary

Total number of images collected287
Total exposure time212.9 minutes
Data collection exposure time210.2 minutes
Data collection wall-clock time242.8 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f201361.8° phi1.800°45 secondsYes
data collections02f18 32.4° omega1.800°45 secondsYes
data collections03f60108.0° omega1.800°45 secondsYes
Phi/Chii01f - i08f820 seconds

Scalepack Scaling

Deleted observations

Rejected  78
Zero sigma or profile test  29
Overload or incomplete profile 588
Sigma cutoff  27
High resolution limit  52

Final Data Set

Scale factor range8.16-11.38
Number of 'full' reflections  3571
Number of 'partial' reflections 12450
Total number of integrated reflections 14884
Total number of unique reflections  3845
Data completeness  97.7%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   10.7
Average Sigma(I)    1.2
Overall R-merge (linear)  0.096

Sadabs Results

Parameter refinement on 7081 reflections reduced R(int) from 0.0836 to 0.0494

Before rejection, 15253 reflections total and 3941 unique

After rejection, 15112 reflections total and 3938 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    7.4  0.0908   0.771 - 0.972   0.914 - 1.308   1.172   11052    6057
    2   -6.8  0.1091   0.764 - 0.939   0.890 - 1.240   1.263     855     413
    3   -6.8  0.0979   0.914 - 1.305   0.847 - 1.059   1.163    3205    1773
Ratio of minimum to maximum apparent transmission: 0.647294

Metadata

  Group    Mike Hursthouse  
  Operator   Mike Hursthouse  
  Sample Owner     
  Local Code   tlt374cAB1-2  
  Formula     
  Crystal Colour    Colourless  
  Crystal Habit    Lath  
  Crystal Size   0.2 x 0.1 x 0.02 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    'graphite'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. SADABS - Bruker Nonius area detector scaling and absorption correction - V2.10

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/