EPSRC National Crystallography Service
Data Collection Summary kccd1 (dellboy)

Summary report for Directory: diska/04skc0006

Report generated Aug 30, 2004; 12:07:55

Unit cell

984 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
a (Angstrom)5.2389 +/- 0.0008
b (Angstrom)11.1855 +/- 0.0017
c (Angstrom)7.5095 +/- 0.0007
alpha (°) 90.000
beta (°)95.312 +/- 0.009
gamma (°) 90.000
Volume (A**3)438.16 +/- 0.10
Mosaicity (°)1.031 +/- 0.007

Data collection


Total number of images collected157
Total exposure time252.9 minutes
Data collection exposure time248.9 minutes
Data collection wall-clock time262.4 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance32.00 mm


TypeName# imagesTotal
Per frame
per frame
Used in
data collections01f113226.0° phi2.000°100 secondsYes
data collections02f36 72.0° omega2.000°100 secondsYes
Phi/Chii01f - i08f830 seconds

Scalepack Scaling

Deleted observations

Rejected  37
Zero sigma or profile test   1
Overload or incomplete profile 120
Sigma cutoff   1

Final Data Set

Scale factor range9.99-10.34
Number of 'full' reflections  1418
Number of 'partial' reflections  2982
Total number of integrated reflections  4142
Total number of unique reflections  1052
Data completeness  98.2%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   25.7
Average Sigma(I)    1.7
Overall R-merge (linear)  0.084

Sadabs Results

Parameter refinement on 2801 reflections reduced R(int) from 0.0867 to 0.0687

Before rejection, 4200 reflections total and 1056 unique

After rejection, 4139 reflections total and 1056 unique


  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    9.3  0.0815   0.923 - 1.058   0.888 - 1.348   1.203    3168    2333
    2   -8.7  0.0876   0.618 - 0.692   0.767 - 1.234   1.199     971     743
Ratio of minimum to maximum apparent transmission: 0.568840


  Group    Service  
  Sample Owner     
  Local Code     
  Crystal Colour    Colourless  
  Crystal Habit    Block  
  Crystal Size   0.1 x 0.1 x 0.1 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file

Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    'graphite'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

'COLLECT (Hooft, R.W.W., 1998)'
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/