EPSRC National Crystallography Service
Data Collection Summary kccd1 (dellboy)


Summary report for Directory: diska/04skc0002

Report generated Jul 17, 2004; 09:47:01

Unit cell

2032 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p1
a (Angstrom)7.5646 +/- 0.0009
b (Angstrom)8.3535 +/- 0.0011
c (Angstrom)9.2005 +/- 0.0007
alpha (°)66.417 +/- 0.007
beta (°)71.945 +/- 0.007
gamma (°)73.035 +/- 0.006
Volume (A**3)497.11 +/- 0.10
Mosaicity (°)0.719 +/- 0.005

Data collection

Summary

Total number of images collected220
Total exposure time7.2 hours
Data collection exposure time7.1 hours
Data collection wall-clock time7.4 hours

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f179358.0° phi2.000°120 secondsYes
data collections02f16 32.0° omega2.000°120 secondsYes
data collections03f17 34.0° omega2.000°120 secondsYes
Phi/Chii01f - i08f850 seconds

Scalepack Scaling

Deleted observations

Rejected  35
Zero sigma or profile test   1
Overload or incomplete profile 170
Sigma cutoff   7
High resolution limit   9

Final Data Set

Scale factor range9.59-10.48
Number of 'full' reflections  3862
Number of 'partial' reflections  3880
Total number of integrated reflections  7320
Total number of unique reflections  2237
Data completeness  98.2%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   13.2
Average Sigma(I)    1.3
Overall R-merge (linear)  0.082

Sadabs Results

Parameter refinement on 3791 reflections reduced R(int) from 0.0614 to 0.0470

Before rejection, 7405 reflections total and 2247 unique

After rejection, 7295 reflections total and 2244 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    7.4  0.0817   1.068 - 1.275   0.900 - 1.175   1.203    6292    3817
    2   -6.8  0.0736   0.692 - 0.795   0.927 - 1.095   1.159     487     312
    3   -6.8  0.0878   0.234 - 0.250   0.920 - 1.111   1.145     516     301
Ratio of minimum to maximum apparent transmission: 0.765810

Metadata

  Group    Mike Hursthouse  
  Operator   Suzanna Ward  
  Sample Owner     
  Local Code   TLT374D E9  
  Formula   C8H12O6N2  
  Crystal Colour    Colourless  
  Crystal Habit    Lath  
  Crystal Size   0.15 x 0.08 x 0.02 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    'graphite'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. SADABS - Bruker Nonius area detector scaling and absorption correction - V2.10

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/