EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: home/diska/2005slh0424

Report generated Jul 29, 2005; 09:51:58

Unit cell

4266 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
c2
a (Angstrom)25.0172 +/- 0.0010
b (Angstrom)8.8336 +/- 0.0002
c (Angstrom)16.5575 +/- 0.0006
alpha (°) 90.000
beta (°)97.2625 +/- 0.0016
gamma (°) 90.000
Volume (A**3)3629.7 +/- 0.2
Mosaicity (°)0.858 +/- 0.002

Data collection

Summary

Total number of images collected183
Total exposure time89.5 minutes
Data collection exposure time88.1 minutes
Data collection wall-clock time102.0 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.80 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f125250.0° phi2.000°30 secondsYes
data collections02f16 32.0° omega2.000°30 secondsYes
data collections03f34 68.0° omega2.000°30 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected 152
Zero sigma or profile test   3
Overload or incomplete profile 786
Sigma cutoff  11
High resolution limit   1

Final Data Set

Scale factor range7.00-11.51
Number of 'full' reflections  9683
Number of 'partial' reflections 13312
Total number of integrated reflections 22011
Total number of unique reflections  4441
Data completeness  99.3%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity  129.1
Average Sigma(I)    3.7
Overall R-merge (linear)  0.049

Sadabs Results

Parameter refinement on 16838 reflections reduced R(int) from 0.0809 to 0.0429

Before rejection, 21556 reflections total and 4456 unique

After rejection, 21294 reflections total and 4455 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    8.2  0.0433   1.024 - 1.251   0.942 - 1.184   1.407   15383   12458
    2   -7.6  0.0425   0.567 - 0.627   0.942 - 1.133   1.394    1776    1483
    3   -7.6  0.0582   0.611 - 0.793   0.942 - 1.272   1.455    4135    3208
Ratio of minimum to maximum apparent transmission: 0.740814

Metadata

  Group    Personal  
  Operator   Mike Hursthouse  
  Sample Owner   S L Huth  
  Local Code   150c  
  Formula   C34H32N6O4P2S4Ni1I2  
  Crystal Colour    Orange  
  Crystal Habit    Lath  
  Crystal Size   0.2 x 0.06 x 0.02 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/