EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: home/diska/04src0794

Report generated Oct 08, 2004; 16:17:52

Unit cell

9740 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p222
a (Angstrom)13.6567 +/- 0.0003
b (Angstrom)17.3548 +/- 0.0002
c (Angstrom)33.7597 +/- 0.0007
alpha (°) 90.000
beta (°) 90.000
gamma (°) 90.000
Volume (A**3)8001.4 +/- 0.3
Mosaicity (°)0.5600 +/- 0.0010

Data collection

Summary

Total number of images collected388
Total exposure time129.4 minutes
Data collection exposure time128.1 minutes
Data collection wall-clock time160.5 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance40.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f288288.0° phi1.000°20 secondsYes
data collections02f59 59.0° omega1.000°20 secondsYes
data collections03f33 33.0° omega1.000°20 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected 516
Zero sigma or profile test  31
Overload or incomplete profile2792
Sigma cutoff  57
High resolution limit 220

Final Data Set

Scale factor range7.90-23.17
Number of 'full' reflections 22178
Number of 'partial' reflections 53162
Total number of integrated reflections 67627
Total number of unique reflections  9959
Data completeness  99.7%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   20.6
Average Sigma(I)    1.2
Overall R-merge (linear)  0.090

Sadabs Results

Parameter refinement on 44303 reflections reduced R(int) from 0.2428 to 0.0668

Before rejection, 72792 reflections total and 10034 unique

After rejection, 71170 reflections total and 10027 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1   15.6  0.0974   0.623 - 1.221   0.934 - 1.208   1.362   54075   34105
    2  -11.8  0.0728   0.652 - 1.118   0.908 - 1.518   1.322   11268    8297
    3  -14.3  0.0831   0.431 - 0.476   0.936 - 1.238   1.407    5827    3910
Ratio of minimum to maximum apparent transmission: 0.598261

Metadata

  Group    Service  
  Operator   Simon Coles  
  Sample Owner   Davies  
  Local Code   304-306-1  
  Formula   C11H23Cl2N4O6P3  
  Crystal Colour    Colourless  
  Crystal Habit    Blade  
  Crystal Size   0.42 x 0.12 x 0.01 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/