EPSRC National Crystallography Service
Data Collection Summary kccd1 (dellboy)


Summary report for Directory: diska/2010sl0008

Report generated Dec 09, 2010; 13:02:06

Unit cell

20589 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p2
a (Angstrom)6.3923 +/- 0.0012
b (Angstrom)7.4769 +/- 0.0010
c (Angstrom)21.635 +/- 0.004
alpha (°) 90.000
beta (°)89.970 +/- 0.007
gamma (°) 90.000
Volume (A**3)1034.1 +/- 0.3
Mosaicity (°)1.465 +/- 0.007

Data collection

Summary

Total number of images collected299
Total exposure time89.7 minutes
Data collection exposure time88.4 minutes
Data collection wall-clock time115.2 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance33.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f188282.0° phi1.500°18 secondsYes
data collections02f69103.5° omega1.500°18 secondsYes
data collections03f34 51.0° omega1.500°18 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected  17
Zero sigma or profile test 489
Overload or incomplete profile 380
Sigma cutoff 226
High resolution limit  41

Final Data Set

Scale factor10.00
Number of 'full' reflections    66
Number of 'partial' reflections 14180
Total number of integrated reflections 11863
Total number of unique reflections  2393
Data completeness  92.6%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity    4.6
Average Sigma(I)    1.2
Overall R-merge (linear)  0.221

Sadabs Results

Estimated minimum and maximum transmission: 0.3850 0.7456

Metadata

  Group    Dr S. Coles  
  Operator   Sam Ling  
  Sample Owner     
  Local Code   tlt 702/2  
  Formula   C13 H8 F3 N1  
  Crystal Colour    Colourless  
  Crystal Habit    Block  
  Crystal Size   0.26 x 0.11 x 0.05 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS 2007/2 (Sheldrick, G.M., 2007)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    'graphite'
_diffrn_measurement_device_type   'Bruker-Nonius Roper CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   '9.091'

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2007). SADABS. Version 2007/2. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/