EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: home/diska/2005src1160

Report generated Sep 26, 2005; 15:08:17

Unit cell

2801 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p2
a (Angstrom)11.3155 +/- 0.0004
b (Angstrom)5.41320 +/- 0.00010
c (Angstrom)19.0128 +/- 0.0007
alpha (°) 90.000
beta (°)91.0959 +/- 0.0016
gamma (°) 90.000
Volume (A**3)1164.38 +/- 0.06
Mosaicity (°)0.566 +/- 0.002

Data collection

Summary

Total number of images collected194
Total exposure time64.0 minutes
Data collection exposure time62.7 minutes
Data collection wall-clock time77.6 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f113226.0° phi2.000°20 secondsYes
data collections02f22 44.0° omega2.000°20 secondsYes
data collections03f51102.0° omega2.000°20 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected 129
Overload or incomplete profile 540
Sigma cutoff  18
High resolution limit  58

Final Data Set

Scale factor range6.22-15.65
Number of 'full' reflections  9417
Number of 'partial' reflections  6447
Total number of integrated reflections 15098
Total number of unique reflections  2927
Data completeness  99.7%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity  118.6
Average Sigma(I)    3.4
Overall R-merge (linear)  0.059

Sadabs Results

Parameter refinement on 11266 reflections reduced R(int) from 0.1439 to 0.0489

Before rejection, 15098 reflections total and 2952 unique

After rejection, 14902 reflections total and 2951 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    7.4  0.0423   0.683 - 1.058   0.881 - 1.149   1.416    9105    7163
    2   -6.8  0.0876   0.795 - 0.940   0.920 - 1.410   1.541    1703    1252
    3   -6.8  0.0608   0.753 - 1.374   0.881 - 1.460   1.591    4094    2975
Ratio of minimum to maximum apparent transmission: 0.603028

Metadata

  Group    Service  
  Operator   Simon Coles  
  Sample Owner   Skabara  
  Local Code   SeF2  
  Formula   C26H32F2Se2  
  Crystal Colour    Pale Yellow  
  Crystal Habit    Blade  
  Crystal Size   0.38 x 0.08 x 0.02 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/