EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: home/diska/04src0988r

Report generated Nov 18, 2004; 17:17:28

Unit cell

2364 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
c2
a (Angstrom)41.724 +/- 0.002
b (Angstrom)4.9727 +/- 0.0003
c (Angstrom)9.7274 +/- 0.0006
alpha (°) 90.000
beta (°)101.534 +/- 0.003
gamma (°) 90.000
Volume (A**3)1977.5 +/- 0.2
Mosaicity (°)0.755 +/- 0.004

Data collection

Summary

Total number of images collected159
Total exposure time129.1 minutes
Data collection exposure time126.4 minutes
Data collection wall-clock time137.9 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f93186.0° phi2.000°50 secondsYes
data collections02f42 84.0° omega2.000°50 secondsYes
data collections03f16 32.0° omega2.000°50 secondsYes
Phi/Chii01f - i08f820 seconds

Scalepack Scaling

Deleted observations

Rejected 135
Zero sigma or profile test   1
Overload or incomplete profile 382
Sigma cutoff   8
High resolution limit  83

Final Data Set

Scale factor range8.18-18.85
Number of 'full' reflections  4974
Number of 'partial' reflections  5582
Total number of integrated reflections  9668
Total number of unique reflections  2502
Data completeness  99.4%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   53.0
Average Sigma(I)    2.6
Overall R-merge (linear)  0.084

Sadabs Results

Parameter refinement on 6125 reflections reduced R(int) from 0.2009 to 0.0648

Before rejection, 9915 reflections total and 2546 unique

After rejection, 9610 reflections total and 2542 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    7.4  0.0816   1.033 - 1.694   0.906 - 1.381   1.445    5928    3863
    2   -6.8  0.0871   0.372 - 0.701   0.906 - 1.342   1.390    2773    1898
    3   -6.8  0.0955   0.499 - 0.604   0.908 - 1.050   1.349     909     638
Ratio of minimum to maximum apparent transmission: 0.655860

Metadata

  Group    Service  
  Operator   Simon Coles  
  Sample Owner   Murphy  
  Local Code   AJ172C  
  Formula   C22H26N2O4  
  Crystal Colour    Colourless  
  Crystal Habit    Plate  
  Crystal Size   0.26 x 0.08 x 0.005 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/