EPSRC National Crystallography Service
Data Collection Summary kccd2 (damien)


Summary report for Directory: home/diska/2005src1384

Report generated Nov 08, 2005; 16:41:41

Unit cell

4869 reflections with 2.91°<theta<27.48° (resolution between 7.00A and 0.77A) were used for unit cell refinement

Symmetry used
in scalepack
p2
a (Angstrom)12.3195 +/- 0.0004
b (Angstrom)10.9268 +/- 0.0003
c (Angstrom)15.3901 +/- 0.0005
alpha (°) 90.000
beta (°)94.9591 +/- 0.0017
gamma (°) 90.000
Volume (A**3)2063.95 +/- 0.11
Mosaicity (°)1.230 +/- 0.002

Data collection

Summary

Total number of images collected353
Total exposure time77.3 minutes
Data collection exposure time76.0 minutes
Data collection wall-clock time106.9 minutes

Experimental Conditions

Wavelength0.71073 A
Crystal to detector distance30.00 mm

Scans

TypeName# imagesTotal
Rotation
Per frame
Rotation
Exposure
per frame
Used in
scaling
data collections01f192192.0° phi1.000°13 secondsYes
data collections02f108108.0° omega1.000°13 secondsYes
data collections03f45 45.0° omega1.000°13 secondsYes
Phi/Chii01f - i08f810 seconds

Scalepack Scaling

Deleted observations

Rejected 346
Zero sigma or profile test   7
Overload or incomplete profile1296
Sigma cutoff  64
High resolution limit  58

Final Data Set

Scale factor range9.66-15.96
Number of 'full' reflections     0
Number of 'partial' reflections 26113
Total number of integrated reflections 24428
Total number of unique reflections  4968
Data completeness 100.0%
Resolution range7.00-0.77 A
Theta range2.91°-27.48°
Average Intensity   73.5
Average Sigma(I)    2.7
Overall R-merge (linear)  0.072

Sadabs Results

Parameter refinement on 20016 reflections reduced R(int) from 0.0929 to 0.0583

Before rejection, 25117 reflections total and 4982 unique

After rejection, 24584 reflections total and 4981 unique

Runs

  Run 2-theta  R(int)  Incid. factors  Diffr. factors    K     Total I>2sig(I)
    1    7.4  0.0634   1.022 - 1.446   0.835 - 1.612   1.510   13509   11060
    2   -6.8  0.0670   0.572 - 0.730   0.883 - 1.394   1.433    7943    6527
    3   -6.8  0.0678   0.605 - 0.767   0.960 - 1.561   1.486    3132    2524
Ratio of minimum to maximum apparent transmission: 0.518395

Metadata

  Group    Service  
  Operator   Simon Coles  
  Sample Owner   Butler  
  Local Code   IAN2  
  Formula   C44H36Br4NiP2Fe2  
  Crystal Colour    Green  
  Crystal Habit    Blade  
  Crystal Size   0.30 x 0.04 x 0.01 (mm3) 
  Temperature   120(K) 
  Generator   50 (kV)   85 (mA) 
  Primary Solvent     
  Other Solvents     

File Explanations

SampleCode.zip
      SampleCode.hkl - data corrected using  SADABS
      SampleCode_merge_none.hkl - equivalents and friedels kept separate  (See "Final Data Set" table in this report)
      SampleCode.p4p - skeleton p4p file for use with XPREP
      SampleCode.htm - this summary file


Southampton CIF entry fields

_exptl_absorpt_process_details       'SADABS V2.10 (Sheldrick, G.M., 2003)'

_diffrn_ambient_temperature           120(2)
_diffrn_radiation_wavelength           0.71073
_diffrn_radiation_type                      MoK\a
_diffrn_radiation_source                  'Bruker-Nonius FR591 rotating anode'
_diffrn_radiation_monochromator    '10cm confocal mirrors'
_diffrn_measurement_device_type  'Bruker-Nonius 95mm CCD camera on \k-goniostat'
_diffrn_measurement_method          '\f & \w scans'
_diffrn_detector_area_resol_mean   9.091

_computing_data_collection        
'COLLECT (Hooft, R.W.W., 1998)'
_computing_cell_refinement        
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)'
#Although determined using DirAx, the cell is refined in the HKL
#package during data reduction
_computing_data_reduction         
'DENZO (Otwinowski & Minor, 1997) & COLLECT (Hooft, R.W.W., 1998)' 

Software References

Unit Cell Determination using DirAx:
Duisenberg AJM. Indexing in Single-Crystal Diffractometry with an Obstinate List of Reflections. Journal of Applied Crystallography 1992; 25: 92-96.
Duisenberg AJM, Hooft RWW, Schreurs AMM, Kroon J. Accurate cells from area-detector images. Journal of Applied Crystallography 2000; 33: 893-898.

Diffractometer control and strategy calculation using COLLECT:
Hooft RWW. COLLECT data collection software, Nonius B.V., 1998.

Standard Data Reduction using HKL(Denzo & Scalepack):
Otwinowski Z, Minor W. Processing of X-ray diffraction data collected in oscillation mode. Macromolecular Crystallography, Pt A. 1997; 276: 307-326.

Absorption Correction
Sheldrick, G. M. (2003). SADABS. Version 2.10. Bruker AXS Inc., Madison, Wisconsin, USA.

Non-Standard Data Reduction using EvalCCD:
Duisenberg AJM, Kroon-Batenburg LMJ, Schreurs AMM. An intensity evaluation method: EVAL-14. Journal of Applied Crystallography 2003; 36: 220-229.

For more information visit the service web site at: http://www.soton.ac.uk/~xservice/